IJIRST (International Journal for Innovative Research in Science & Technology)ISSN (online) : 2349-6010

 International Journal for Innovative Research in Science & Technology

PIC Based Frequency and RMS Value Measurement


Print Email Cite
International Journal for Innovative Research in Science & Technology
Volume 3 Issue - 8
Year of Publication : 2017
Authors : Alankar Mahadev Salunkhe ; R. R. Jagtap

BibTeX:

@article{IJIRSTV3I8047,
     title={PIC Based Frequency and RMS Value Measurement},
     author={Alankar Mahadev Salunkhe and R. R. Jagtap},
     journal={International Journal for Innovative Research in Science & Technology},
     volume={3},
     number={8},
     pages={55--62},
     year={},
     url={http://www.ijirst.org/articles/IJIRSTV3I8047.pdf},
     publisher={IJIRST (International Journal for Innovative Research in Science & Technology)},
}



Abstract:

For a nation its Economical development depends widely on factors such as its education, industrial growth and many other factors and one of the most important factors amongst them is Energy consumption. Currently in our country we are facing problem such as losses in production, transmission and distribution of power which causes financial damage for everyone. Electrical parameters such as voltage and current are important but in spite of that Frequency and RMS value of voltage and current are also important. There is no unique system for frequency and rms value measurement because of continuous isolation required for instrument and accuracy of instrument vary due to substantial changes in supply voltage and current under non-sinusoidal conditions. Proposed system is simple and can proved to be more efficient to measure frequency and rms value of voltage and current in both sinusoidal as well as non-sinusoidal supply conditions.


Keywords:

Frequency Measurement, RMS Value Measurement, ZCD


Download Article